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专利名称:CIRCUIT ARRANGEMENT AND METHOD FOR
CONTROLLING AND EVALUATINGDETECTOR SIGNALS
发明人:MEDNIKOV, FELIX,SELLEN,
MARTIN,WISSPEINTNER, KARL
申请号:EP019883.1申请日:20010808公开号:EP1311804B1公开日:20130508
摘要:The invention relates to a circuit arrangement (1) for controlling and evaluatingsignal sensors, particularly for parametric sensors with complex impedance, comprising atleast one sensor (2) for detecting mechanical variations. In order to minimise or restrict asfar as possible the number of temperature-related disruptions in a simple constructiveembodiment, the measuring signal, the absolute temperature and the gradienttemperature of the sensor (2) are simultaneously detectable, preferably by a
microprocessor or microcalculator(3). The invention also relates to a further method forcontrolling and evaluating the signals of sensors.
申请人:MICRO-EPSILON MESSTECHNIK GMBH & CO. KG,MICRO EPSILONMESSTECHNIK,MICRO-EPSILON MESSTECHNIK GMBH & CO. KG
地址:DE
国籍:DE
代理机构:Naumann, Ulrich
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