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专利名称：CONDITION ASSESSMENT OF NONLINEAR
PROCESSES
发明人：HIVELY, LEE, M.,GAILEY, PAUL,
C.,PROTOPOPESCU, VLADIMIR, A.
申请号：US0107104申请日：20010306公开号：WO0167288A3公开日：20020418
摘要：There is presented a reliable technique for measuring condition change innonlinear data such as brain waves. The nonlinear data is filtered and discretized intowindowed data sets. The system dynamics within each data set is represented by asequence of connected phase-space points, and for each data set a distribution functionis derived. New metrics are introduced that evaluate the distance between distributionfunctions. The metrics are properly renormalized to provide robust and sensitive relativemeasures of condition change. As an example, these measures can be used on EEG data,to provide timely discrimination between normal, pre-seizure, seizure, and post-seizurestates in epileptic patients. Apparatus utilizing hardware or software to perform themethod and provide an indicative output is also disclosed.
申请人：UT-BATTELLE, LLC
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